As a grand event for the laser, optics, and optoelectronics industries in Asia, the 2024 Munich Shanghai Expo will be grandly opened at the Shanghai New International Expo Center from March 20 to 22. Optical technology and laser technology play a key role in semiconductor testing, chip manufacturing, new energy vehicle manufacturing and other fields, greatly promoting the country's informatization construction and economic development. At this event, Instrument Systems will co-exhibit with Giant Optics to showcase cutting-edge measurement technology from Germany and provide consulting services based on your measurement needs. Our booth is located at Hall W4 4417 , and we look forward to seeing you! Instrument Systems will be showcasing a range of proven and innovative solutions in the areas of display technology, augmented reality/virtual reality (AR/VR) and vertical cavity surface emitting laser (VCSEL) measurement. A highlight of our booth at this year's show is the new generation of large-size and curved display measurement solutions. The fully automatic 7-axis DMS 904 goniometer is designed for optical property testing of large-size displays, including Pillar-to-Pillar displays that span the entire width of the vehicle.   Several experienced optical measurement technicians will introduce you to optical measurement technology on site and provide the most suitable solution for your measurement needs. We look forward to your visit! Our measurement applications Display production measurement The LumiTop 4000 display system measures display uniformity, color cast, flicker, gamma, defect detection (mura) and other characteristics in one stop. AR/VR Measurement LumiTop AR/VR and DMS goniometer systems can inspect and correct the uniformity, contrast, angle dependence and color fidelity of near-eye displays. MicroLED Measurements LumiTop X150 high-resolution imaging colorimetry system for sub-pixel analysis and pixel defect testing of OLED and MicroLED displays. Large vehicle display screen measurement DMS 904 goniometer has 7-axis linkage to accurately measure the display's photoelectric conversion characteristics (EOTF), switching speed, response time, flicker, etc. VCSEL Measurements The VTC and PVT series VCSEL measurement systems can perform eye safety tests on VCSEL lasers according to the international laser safety standard IEC60825, including far-field, near-field and nanosecond pulse measurements. IR/NIR Measurements The infrared measurement system with the CAS 140D IR high-end spectrometer as the core can measure the spectrum, power, LIV curve, temperature dependence of optical output and angle resolution measurement of infrared and near-infrared light sources. We look forward to seeing you at the 2024 Shanghai Munich Expo!

VCSEL arrays are found to have numerous applications in consumer electronics, including structured light sources in time-of-flight (ToF) or 3D sensing, proximity lighting in face recognition (FR), gesture recognition (GR), etc. This study focuses on detailed and comprehensive LIV testing, spectral and beam analysis of the entire VCSEL array and each emitter within it. Necessity of 2D LIV+λ detection for single emitters   Essential for demanding applications such as facial recognition, 3D sensing, in-cabin sensing, LiDAR and range finding Investigating crosstalk between transmitters Parallelize measurements to reduce overall measurement time LIV curves are the most basic measurement method used to determine the electrical and optical operating characteristics of laser diodes. These curves establish the threshold current, slope efficiency, flip point, whether there are any kinks, etc. They are widely used at different stages because it is critical to identify faulty DUTs early in the manufacturing process. LIV characteristics of the entire VCSEL array   Measure LI and IV curves of the entire array from 200 mA to 1.8 A Calculate the slope efficiency, threshold current and flip current based on the LI curve In the IV curve, the voltage increases approximately linearly with the expected current.  LIV characteristics of all emitters in the entire array     The VCSEL array used in this measurement consists of 281 emitters. The slope efficiency and threshold current of each emitter were measured External emitter has higher slope efficiency but lower threshold current Internal emitters have small variations in both quantities In addition to the LIV curves, we also measured spectra of individual emitters (15 emitters were selected for the array) at different currents, similar to the LIV curves. The spectra are shown in the figure below. Each sub-figure represents an emitter, and its spectrum is color-coded at different currents (blue at 400 mA to red at 1.8 A). We observe a shift in the spectrum at higher currents, and higher-order modes also appear as the current increases. \\   in conclusion We have extended the existing 1D LIV testing, spectroscopy and beam analysis to cover every single emitter in the VCSEL array. This approach not only enables parallelization of the measurements, reducing the overall measurement time, but also provides the opportunity to study the mutual influence between individual emitters. VTC 4000: Flexible and precise single emitter analysis Our unique measurement solution, with well-defined requirements from customers, allows identification of emitters in an array that are underperforming or out of specification. We believe that this comprehensive characterization of individual emitters is critical for demanding applications. This allows VCSEL manufacturers to ensure compliance of the final product without incurring any packaging costs and speed up the manufacturing process.

\\  The LumiTop X20 and X30 imaging colorimeters recently released by Instrument Systems of Germany provide advanced solutions for display testing under special brightness conditions. These two colorimeters have excellent performance, including high resolution (20 MP and 31 MP) and a wide dynamic range (from mcd/m² to Mcd/m²), which are particularly suitable for uniformity measurement and error detection. LumiTop X20 and LumiTop X30 are designed for production testing of displays at specific brightness levels. The spectrally optimized LumiTop technology is trusted by customers as a powerful tool for display quality assurance. This technology enables display manufacturers to test over a wide range of brightness levels, from high brightness levels of hundreds of Mcd/m² to low brightness levels of 0.001 cd/m² to 0.1 cd/m², taking into account the human eye's adaptability to different brightness levels. Today's displays have advanced brightness features that can intelligently adjust brightness to improve user experience and reduce eye fatigue. Therefore, accurate brightness and color testing is critical when designing and manufacturing displays, especially for performance testing under low-light conditions. LumiTopX20 and X30 imaging colorimeters are equipped with high-resolution cameras (20MP and 31MP), flexible field of view (FOV) achieved by high-precision motorized lenses, and a wide dynamic range, making them ideal measurement tools. In addition to the outstanding design, the LumiTop X20 and X30 also feature a new flicker sensor for the frequency range of 1 Hz to 1 kHz. Through the LumiTop series of imaging colorimeters, combined with high-resolution cameras, fast photometers, flicker sensors and CAS high-precision spectrometers, Instrument Systems continues to lead the field of display measurement technology, providing reliable assurance of display quality under low and high brightness conditions.   LumiTop measurement solutions are the industry’s trusted standard for display measurement. If you have any questions about display and Mini/MicroLED measurement, please feel free to contact us （[email protected]）to get solutions from Giant-Testing’s optical measurement team.